Applied Mathematics and Nonlinear Sciences
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Journal

Applied Mathematics and Nonlinear Sciences


Volume
& Issue

Volume 8, Issue 2


Published
on

September 9, 2023


Pages


DOI

Article

Characterization of second-order chaotic circuits with heterogeneous memristors

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Authors

Rong Li Affiliation:
College of Intelligent Manufacturing, Hunan University of Science and Engineering, Yongzhou, Hunan, 425199, China.


Abstract

Amnesia-resistive chaotic circuits have various application prospects due to their unique circuit characteristics. In this paper, by studying the relationship between memristors and chaotic circuits, two models of magneto-controlled memristors with smooth quadratic monotonic rise nonlinear characteristics are constructed based on Tsai’s circuit, and an active memristor circuit composed of negative conductance is combined to replace Tsai’s diode in Tsai’s circuit system, and then a magneto-controlled memristor is inserted between the LC resonant part of the circuit, thus establishing a heterogeneous memristor second-order chaotic circuit. Multisim is used for device modeling, circuit construction, and system composition and simulation. The simulation tests show that when t ∈ [0,900] ∪ [1800,2500], the system exhibits a chaotic state. When t ∈ (900,1800), the system exhibits a periodic state. As the initial value parameter d varies between [2,4.64], the state of the system shifts between chaotic and hyperchaotic states, while the complexity of the system changes back and forth. This study demonstrates that the heterogeneous magneto-controlled memristor chaotic circuit has a rich, chaotic behavior, providing an effective reference for applying chaotic memristor circuits.


Keywords

Heterogeneous memristor, Second-order chaotic circuit, Chua’s circuit, Chaotic state, System complexity, 68T05


Citation

Li, R. (2023). Characterization of second-order chaotic circuits with heterogeneous memristors. Applied Mathematics and Nonlinear Sciences, 8(2). https://doi.org/10.2478/amns.2023.2.00328

Published by: Engineering Journals

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