Turkish Journal of Computer and Mathematics Education
Journal license

Journal

Turkish Journal of Computer and Mathematics Education


Volume
& Issue

Volume 13, Issue 1


Published
on


Pages

203-207


DOI

Article

MgZnO spacer thickness dependence of 2DEG concentration and I-V characteristics of MgZnO/ZnO hetero structure


Authors

Kyunghan Chun* Affiliation:
Department of Electronic Engineering, Daegu Catholic University, Gyeongbuk, Korea


Abstract

In this paper, we investigate that the spacer layer thickness affects the polarization effect on the two-dimensional electron gas (2DEG) concentration and current-voltage properties in an MgZnO/ZnO hetero structure. In the conduction band edge profile, MgZnO/ZnO hetero structure with a thick layer of spacer shows sharper bending. As a result, the MgZnO/ZnO hetero structure with a relatively thick layer of spacer is expected to surpass the MgZnO/ZnO hetero structure with a thin layer of spacer in the carrier confinement. However, if the spacer layer thickness exceeds 30nm, the carrier concentration will no longer increase. The drain current and pinch-off voltage have been shown to be proportional to the spacer layer thickness from the addition in electron density due to the increased spacer layer thickness.


Keywords

2-DEG, ZnO, MgZnO, HEMT, heterostructure


Citation

Chun, K. (2022). Mgzno spacer thickness dependence of 2DEG concentration and I-V characteristics of mgzno/zno hetero structure. Turkish Journal of Computer and Mathematics Education, 13(1), 203–207.

Published by: Engineering Journals

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